Semiconductor apparatus for monitoring critical path delay...

Details Semiconductor apparatus for monitoring critical path delay... Semiconductor apparatus for monitoring critical path delay...

2007-09-04

2007-09-04

Nguyen, Linh My (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Specific signal discriminating without subsequent control

By presence or absence pulse detection

C714S700000

Reexamination Certificate

active

10713365

ABSTRACT:
A semiconductor apparatus for flexibly and effectively configuring a delay monitor circuit without an increase in circuit scale includes a delay signal generation circuit for switching the configuration of delay element arrays based on first configuration information and second configuration information and propagating a delay element array wherein a pulse is switched, a register group having a first register for the first configuration information and a second register for second configuration information, a selector for outputting to the delay signal generation circuit the first configuration information and second configuration information in accordance with an instruction of a selection signal in a time sharing way, and a control circuit for controlling a power source voltage based on delay information of a delay element array and outputting to the selector a selection signal to select from the first configuration information and second configuration information in a time sharing way.

REFERENCES:
patent: 6629250 (2003-09-01), Kopser et al.
patent: 6944801 (2005-09-01), Kojima

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