Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-09-04
2007-09-04
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S760020, C324S765010
Reexamination Certificate
active
10994163
ABSTRACT:
A semiconductor component arrangement includes a semiconductor body, at least a first power semiconductor switching element, and a defect identification circuit. The semiconductor body has a front side and a rear side, and the first power semiconductor switching element is integrated therein. The defect identification circuit is integrated in the semiconductor body, and is displaced at a distance from the first semiconductor switching element. The defect identification circuit includes a temperature sensor and an evaluation circuit, the evaluation circuit coupled to the temperature sensor and configured to generate a defect signal in the event of a sensed temperature indicative of the presence of a defect in the at least one semiconductor switching element. The evaluation circuit has a second semiconductor switching element and a drive circuit therefore.
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Infineon - Technologies AG
Maginot Moore & Beck
Tang Minh N.
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