Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With large area flexible electrodes in press contact with...
Reexamination Certificate
2007-05-22
2007-05-22
Pham, Long (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
With large area flexible electrodes in press contact with...
C257S659000, C257S687000, C257S785000
Reexamination Certificate
active
11241991
ABSTRACT:
A gate electrode (1a) is formed on the outer peripheral step portion (1′) of a semiconductor substrate (1) so as to face a pressure-contact supporting block (6), and a convex contacting portion (1g) is formed on a predetermined position on the surface of the gate electrode to contact the pressure contact supporting block. The surface area of the gate electrode ranging from the inner periphery to a position adjacent to the convex contacting portion, is coated with an insulation film (1d). The convex contacting portion (1g) is formed of a convex portion integral with the gate electrode or formed of another gate electrode (1a′).
REFERENCES:
patent: 0 746 021 (1996-12-01), None
patent: 8-330572 (1996-12-01), None
Oota Kenji
Tokunoh Futoshi
Mitsubishi Denki & Kabushiki Kaisha
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Pham Long
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