Semiconductor device and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

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Details

C257S066000, C257S073000, C257S319000, C257S320000, C257S347000

Reexamination Certificate

active

10677316

ABSTRACT:
It is an object of the present invention to form a TFT which is required to have a high withstanding voltage characteristic as well as to lower an off-current, a TFT which is required to have a high withstanding voltage characteristic as well as to raise an on-current, and a TFT in which a short channel structure and the decline in the threshold voltage arising therefrom are attached importance to, on one and the same substrate. A TFT having gate insulating films with different thickness can be formed on one and the same substrate by providing auxiliary electrodes in addition to the gate electrodes over a semiconductor film as well as laminating the insulating films.

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Specification for abandoned U.S. Appl. No. 07/910,412, filed Jul. 8, 1992.

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