Method and circuit for measuring characteristic parameters...

Details Method and circuit for measuring characteristic parameters... Method and circuit for measuring characteristic parameters...

2007-09-04

2007-09-04

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

C324S620000, C702S069000, C702S191000

Reexamination Certificate

active

11349305

ABSTRACT:
An arrangement is for measuring characteristic parameters of intermodulation distortion of a device under test. The arrangement may include a generator of at least two tones at different test frequencies, and an attenuation path feeding the device with a replica of the two tones attenuated of a factor equal to the gain of the device. The arrangement may also include a circuit for generating a difference signal between the signal output by the device and the two tones, and a circuit input with the difference signal and measuring the characteristic parameters as a function thereof.

REFERENCES:
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patent: 5748001 (1998-05-01), Cabot
patent: 6229316 (2001-05-01), Fukui et al.
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patent: 6567762 (2003-05-01), Bourde et al.
patent: 6766262 (2004-07-01), Martens
patent: 7123023 (2006-10-01), Minihold et al.

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