Spin tunnel transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Bipolar transistor

Reexamination Certificate

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C257S565000, C257SE29033

Reexamination Certificate

active

11446245

ABSTRACT:
Some spin tunnel transistors with a larger current transmittance and a higher MR ratio are described.One of the spin tunnel transistor comprises a collector; an emitter; abase formed between the collector and the emitter, including a first ferromagnetic metal layer variable in its magnetization under an external magnetic field; a barrier layer formed between the first ferromagnetic metal layer and one of the collector and the emitter, the other of the collector and the emitter including a semiconductor crystal layer; and a transition metal silicide crystal layer between the semiconductor crystal layer and the base. The transition metal silicide crystal layer may be replaced with a palladium layer, a transition metal nitride layer, or a transition metal carbide layer.

REFERENCES:
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patent: 5973334 (1999-10-01), Mizushima et al.
patent: 6919608 (2005-07-01), Gregg
patent: 2003/0164509 (2003-09-01), Gregg
patent: 2005/0057960 (2005-03-01), Saito et al.
patent: 2005/0110004 (2005-05-01), Parkin et al.
patent: 2005/0226043 (2005-10-01), Parkin et al.
patent: 2005/0254287 (2005-11-01), Valet
patent: 2007/0007610 (2007-01-01), Saito et al.
D. J. Monsma, et al., “Perpendicular Hot Electron Spin-Valve Effect in a New Magnetic Field Sensor: The Spin-Valve Transistor”, Physical Review Letters, vol. 74, No. 26, Jun. 26, 1995, pp. 5260-5623.
D.J. Monsma, et al., “Room Temperature-Operating Spin-Valve Transistors Formed by Vacuum Bonding”, Science, vol. 281, Jul. 17, 1998, pp. 407-409.

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