Method and apparatus for high resolution coherent optical...

Optical waveguides – Optical fiber bundle – Imaging

Reexamination Certificate

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C385S115000, C385S116000, C600S182000

Reexamination Certificate

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10311358

ABSTRACT:
A method and an apparatus for examining the subsurface microstructure of a sample are provided. Radiation from a plurality of optical radiation sources travels along a first optical path. In the first optical path, a device focuses the optical radiati n from each of the optical sources into a plurality of respective focal points along the first optical path to provide substantially continuous coverage of a selected portion of the first optical path. Then, a sample on the first optical path within the selected length extending into the sample is scanned along said selected portion of the first optical path.

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Page from website http://hft.e-technik.uni-dortmund.de/uk/forschng/pic—oct.1.html, printed on May 3, 2000 —Chair of High Frequency Technique—Research—optical OCT sensor.
Pages from website http://hft.e-technik.uni-dortmund.de/uk/forschng/octsensoruk.html, printed on May 3, 2000—Chair of High Frequency Technique—Research—Sensor for the Optical Coherence Tomography (OCT).

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