Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-05-01
2007-05-01
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S187000, C702S072000, C324S076110, C324S076130
Reexamination Certificate
active
10970580
ABSTRACT:
An electricity metering method and apparatus is provided for determining the phase of first waveform relative to a harmonically distorted, second waveform having cycles temporally distinguished by an occurrence of an amplitude that is neither zero amplitude nor a maximum amplitude of said waveform.
REFERENCES:
patent: 6269317 (2001-07-01), Schachner et al.
patent: 6549859 (2003-04-01), Ward
Barlow Jr. John E.
Chernoff Vilhauer & McClung & Stenzel
Veris Industries, LLC
Vo Hien
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