Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-10
2007-04-10
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S079000, C375S226000
Reexamination Certificate
active
10930683
ABSTRACT:
Methods for estimating data-dependent jitter (DDJ) from measured samples of a transmitted data signal include a first exemplary step of obtaining a plurality of measurements (e.g., time tags and event counts for selected pulse widths in the data signal). Such measurements may be obtained at predetermined intervals within a transmitted signal or may be obtained at randomly selected intervals, and should yield measurements for each data pulse in a repeating data pattern. An average unit interval value representative of the average bit time of the transmitted signal is determined. Time interval error estimates representative of the timing deviation from each signal edge's measured value relative to its ideal value (determined in part from the calculated average unit interval value) are also determined, as well as a classification for each measured signal edge relative to a corresponding data pulse in the repeating data pattern. DDJ delta lines are then calculated for signal edges of each pulse width in the transmitted data pattern, from which peak-to-peak DDJ values and/or estimates of duty-cycle-distortion (DCD) can be determined.
REFERENCES:
patent: 4757452 (1988-07-01), Scott et al.
patent: 4908784 (1990-03-01), Box et al.
patent: 6091671 (2000-07-01), Kattan
patent: 6194925 (2001-02-01), Kimsal
patent: 6298315 (2001-10-01), Li et al.
patent: 6356850 (2002-03-01), Wilstrup et al.
patent: 6898535 (2005-05-01), Draving
Technical Document—Jitter Separation-50 Mb/s To Over 40 Gb/s Using the Agilent 86100C Infiniium DCA-J; pp. 1 through 27, Agilent Technologies, Inc., Dec. 2003.
Technical Document—Analyzing Jitter Using a Spectrum Approach; pp. 1 through 8; Tektronix, Inc., 2002.
Ben-Zeev Mordechai
Miller Paul Frederick
Tabatabaei Sassan
Bui Bryan
Dority & Manning P.A.
Guide Technology, Inc.
Walling Meagan S
LandOfFree
System and method of obtaining data-dependent jitter (DDJ)... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method of obtaining data-dependent jitter (DDJ)..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method of obtaining data-dependent jitter (DDJ)... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3763598