Gauge calibration method

Measuring and testing – Instrument proving or calibrating

Reexamination Certificate

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Details

C073S866100, C250S252100, C250S231110, C340S688000, C362S023000

Reexamination Certificate

active

11210419

ABSTRACT:
The instrument panel gauge assembly includes an applique having gauge graphics printed thereon and a needle pointer for a gauge assembly positioned adjacent thereto. A transparent chaplet is formed within the applique to allow light to pass through. The needle passes over the chaplet as the needle moves. When the needle is positioned directly in front of the chaplet, light is blocked from passing through the chaplet. A light sensing element is positioned behind the applique to detect the presence of light passing through the chaplet. A light baffle guides light passing through the chaplet to the light sensing element. A controller receives a signal from the light sensing element indicating when the needle pointer is directly in front of the chaplet. The controller then compares the actual input to the gauge with the position of the needle pointer, calculates a correction factor, and calibrates the gauge accordingly.

REFERENCES:
patent: 3446981 (1969-05-01), Ackerman et al.
patent: 3573773 (1971-04-01), O'Hanlon
patent: 3698307 (1972-10-01), Reichardt
patent: 3901605 (1975-08-01), Brainard
patent: 3906345 (1975-09-01), Bertolasi
patent: 3980075 (1976-09-01), Heule
patent: 4037219 (1977-07-01), Lewis
patent: 4107661 (1978-08-01), Crosby
patent: 4275393 (1981-06-01), Johnston
patent: 4511798 (1985-04-01), Killingsworth
patent: 4631539 (1986-12-01), Sanders et al.
patent: 5635622 (1997-06-01), King
patent: 6145369 (2000-11-01), Corbin et al.
patent: 6157311 (2000-12-01), Berkovich
patent: 6741184 (2004-05-01), Miller et al.

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