Semiconductor testing device

Details Semiconductor testing device Semiconductor testing device

2007-01-09

2007-01-09

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11046883

ABSTRACT:
A semiconductor testing device is used for testing a semiconductor device which has at least one spherical connection terminal. The testing device includes an insulating substrate having an opening formed therein at a position corresponding to the position of the spherical connection terminal, and a contact member, formed on the insulating substrate, including a connection portion which is connected with the spherical connection terminal, at least the connection portion being deformable and extending into the opening.

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Notice of Reasons of Rejection mailed on Dec. 16, 2003 for the corresponding Japanese Application No. H10-263579.

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