Method and apparatus for layout independent test point...

Details Method and apparatus for layout independent test point... Method and apparatus for layout independent test point...

2007-03-13

2007-03-13

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

10972822

ABSTRACT:
A layout independent test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. Each test access point structure is conductively connected to various locations along a trace at a test access point and above an exposed surface of the printed circuit board to be accessible for probing by a fixture probe.

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