Electrical transmission or interconnection systems – Plural load circuit systems
Reexamination Certificate
2007-04-10
2007-04-10
Jackson, Stephen W. (Department: 2836)
Electrical transmission or interconnection systems
Plural load circuit systems
C327S056000
Reexamination Certificate
active
10785181
ABSTRACT:
There is disclosed a semiconductor integrated circuit device capable of eliminating an influence of a power voltage drop generated in a circuit disposed in the semiconductor integrated circuit device to inhibit an operation defect or an operation speed decrease of the circuit. In a semiconductor integrated circuit device10including a power wiring18connected to a power supply (Vdd) via a power terminal12,a ground wiring20connected to a ground (0 V) via a ground terminal 14, and a plurality of circuits301to30fconnected in parallel with one another between the power wiring18and the ground wiring20,a negative power terminal16connected to a negative power supply (−Vdd) is disposed, and a current source22is disposed as a current generating section between the negative power terminal16and a node Gf on a ground wiring20side of the f-th circuit30fdisposed in a region most distant from the ground.
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Amaya Carlos
Jackson Stephen W.
Oki Electric Industry Co. Ltd.
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