Method for measuring confidence of ball grid array model in...

Details Method for measuring confidence of ball grid array model in... Method for measuring confidence of ball grid array model in...

2007-01-02

2007-01-02

Bali, Vikkram (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C029S833000, C438S016000

Reexamination Certificate

active

10420286

ABSTRACT:
A method for obtaining confidence measure of a ball grid array (BGA) model having a plurality of balls in semiconductor surface mounted devices is provided. The method comprises the steps of extracting BGA images from a real surface mounted device, generating a BGA ball model and a BGA body model, generating a first confidence measure of the BGA ball model wherein the first confidence measure includes a first standard deviation of the BGA ball model and a first local image contrast of each BGA ball, and generating a second confidence measure of the BGA body model wherein the second confidence measure includes a second standard deviation of the BGA body model and a second local image contrast of the BGA body.

REFERENCES:
patent: 5736790 (1998-04-01), Iyogi et al.
patent: 6177682 (2001-01-01), Bartulovic et al.
patent: 6496270 (2002-12-01), Kelley et al.
patent: 2004/0126005 (2004-07-01), Duvdevani et al.

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