Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-05-22
2007-05-22
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C713S400000, C713S401000, C713S500000, C713S600000, C716S030000, C716S030000, C716S030000, C327S262000, C327S284000, C327S378000
Reexamination Certificate
active
11394828
ABSTRACT:
Delays through components of a programmable device are determined transparently to the user through the use of mimic paths. For each delay path to be measured, at least one mimic path is created that has similar components and characteristics to the actual path to be measured. A signal fed through this mimic path will experience similar delay to a signal passing through the actual path, which can be affected by temperature and voltage variations during operation. A swept clock signal can be passed to a register latching the mimic signal data, producing output that can be fed to lead/lag logic to determine a current value of the delay through the mimic path. This delay can be compared to a previous delay determination to approximate an adjustment to be made to a sampling clock used to latch the actual data into the appropriate register at the middle of the latching window.
REFERENCES:
patent: 6002282 (1999-12-01), Alfke
patent: 6631503 (2003-10-01), Hsu et al.
patent: 6734703 (2004-05-01), Alfke et al.
patent: 6819157 (2004-11-01), Cao et al.
patent: 6983394 (2006-01-01), Morrison et al.
patent: 7020862 (2006-03-01), Alfke et al.
patent: 7024326 (2006-04-01), Nygren
patent: 2002/0133789 (2002-09-01), Hsu et al.
patent: 2003/0001634 (2003-01-01), Cao et al.
patent: 2003/0001650 (2003-01-01), Cao et al.
patent: 2005/0020228 (2005-01-01), Yearim
patent: 2005/0097420 (2005-05-01), Frisch et al.
patent: 2006/0038598 (2006-02-01), Reilly et al.
patent: 2006/0267618 (2006-11-01), Yuan et al.
“DDR2-533 Memory Design Guide For Two-Dimm Unbuffered Systems”, Micron Technology, Inc., 2003, pp. 1-19, TN-47-01.
Altera Corporation
Townsend and Townsend & Crew LLP
Tsai Carol S. W.
LandOfFree
Method for providing PVT compensation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for providing PVT compensation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for providing PVT compensation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3744815