Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2007-01-30
2007-01-30
Arbes, Carl J. (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S829000, C029S830000, C029S843000
Reexamination Certificate
active
10823437
ABSTRACT:
A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data regarding a newly designed semiconductor device is received along with data describing the tester and testing algorithms to be used to test the semiconductor device. Using the received data, one or more of the prefabricated elements is selected. Again using the received data, one or more of the selected prefabricated elements is customized. The probe card assembly is then built using the selected and customized elements.
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Leung et al., “Active Substrate Membrane Probe Card,” Center For Integrated Systems Stanford Univeristy (Oct. 12, 1995).
Eldridge Benjamin N.
Grube Gary W.
Khandros Igor Y.
Mathieu Gaetan L.
Arbes Carl J.
Burraston N. Kenneth
Formfactor, Inc.
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