Method and apparatus for synchronizing signals in a testing...

Details Method and apparatus for synchronizing signals in a testing... Method and apparatus for synchronizing signals in a testing...

2007-07-17

2007-07-17

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C331S00100A, C324S076530, C714S738000

Reexamination Certificate

active

10766073

ABSTRACT:
The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.

REFERENCES:
patent: 4629999 (1986-12-01), Hatch et al.
patent: 6859028 (2005-02-01), Toner
patent: 7093177 (2006-08-01), West et al.

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