Drive circuit and method of applying high voltage test thereon

Details Drive circuit and method of applying high voltage test thereon Drive circuit and method of applying high voltage test thereon

2007-01-23

2007-01-23

Wells, Kenneth B. (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Current driver

C324S527000

Reexamination Certificate

active

11063853

ABSTRACT:
A drive circuit that supplies electric power to an electric load from a DC electric source includes a pair of series-connected first and second MOSFETS of the same conduction type, a pair of clamp circuits respectively connected between the drains and gates of the first and second MOSFETS, a series circuit of a first resistor and a switch, a first test terminal; a second test terminal connected to a joint of the first and second MOSFETS, a third test terminal for operating the switch, a fourth test terminal connected a joint of the first resistor and the switch; and a second resistor connected between the gate of the second MOSFET and the first test terminal. The switch and the first resistor are connected between the gate and the source of the first MOSFET to close when the drive circuit is normally operated and to open when it is given a high voltage test.

REFERENCES:
patent: 5796287 (1998-08-01), Furutani et al.
patent: 6392463 (2002-05-01), Kitagawa et al.

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