Output calibrator with dynamic precision

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration

Reexamination Certificate

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Details

C702S117000

Reexamination Certificate

active

07119549

ABSTRACT:
An integrated circuit device having an output driver circuit and a control circuit. The output driver circuit outputs a first signal having a signal level according to a control value. The control circuit is coupled to receive the first signal from the output driver and adjusts the control value by a first increment until a transition event is detected. After the transition event is detected, the control circuit adjusts the control value by a second increment, the second increment being smaller than the first increment.

REFERENCES:
patent: 3646329 (1972-02-01), Yoshino et al.
patent: 4192005 (1980-03-01), Kurtz
patent: 4315210 (1982-02-01), Michel et al.
patent: 4329600 (1982-05-01), Stewart
patent: 4414480 (1983-11-01), Zasio
patent: 4481625 (1984-11-01), Roberts et al.
patent: 4549124 (1985-10-01), Beier
patent: 4680487 (1987-07-01), Kobayashi
patent: 4691127 (1987-09-01), Huizer
patent: 4707620 (1987-11-01), Sullivan et al.
patent: 4715003 (1987-12-01), Keller et al.
patent: 4719369 (1988-01-01), Asano et al.
patent: 4728881 (1988-03-01), Evans et al.
patent: 4765188 (1988-08-01), Krechmery et al.
patent: 4779013 (1988-10-01), Tanaka
patent: 4859877 (1989-08-01), Cooperman et al.
patent: 4860198 (1989-08-01), Takemaka
patent: 4894562 (1990-01-01), Cavaliere et al.
patent: 4939389 (1990-07-01), Cox et al.
patent: 4958520 (1990-09-01), Trommler et al.
patent: 4967105 (1990-10-01), Akamatsu et al.
patent: 4977333 (1990-12-01), Suzuki et al.
patent: 4992724 (1991-02-01), Hisanaga et al.
patent: 5023488 (1991-06-01), Gunning et al.
patent: 5024101 (1991-06-01), Tanaka et al.
patent: 5045730 (1991-09-01), Cooperman et al.
patent: 5045832 (1991-09-01), Tam
patent: 5055715 (1991-10-01), Inaba
patent: 5075569 (1991-12-01), Branson
patent: 5081379 (1992-01-01), Korteling
patent: 5097148 (1992-03-01), Gabara
patent: 5107230 (1992-04-01), King
patent: 5117130 (1992-05-01), Shoji
patent: 5118971 (1992-06-01), Schenck
patent: 5121064 (1992-06-01), Eller
patent: 5134311 (1992-07-01), Biber et al.
patent: 5165046 (1992-11-01), Hesson
patent: 5185538 (1993-02-01), Kondoh et al.
patent: 5194765 (1993-03-01), Dunlop et al.
patent: 5206546 (1993-04-01), Usami
patent: 5237214 (1993-08-01), Usami
patent: 5254883 (1993-10-01), Horowitz et al.
patent: 5296756 (1994-03-01), Patel et al.
patent: 5387824 (1995-02-01), Michelsen
patent: 5457407 (1995-10-01), Shu et al.
patent: 5546042 (1996-08-01), Tedrow et al.
patent: 5568068 (1996-10-01), Ota et al.
patent: 5578940 (1996-11-01), Dillon et al.
patent: 5596285 (1997-01-01), Marbot et al.
patent: 5742798 (1998-04-01), Goldrian
patent: 5778419 (1998-07-01), Hansen et al.
patent: 5838177 (1998-11-01), Keeth
patent: 5977797 (1999-11-01), Gasparik
patent: 6009487 (1999-12-01), Davis et al.
patent: 6072747 (2000-06-01), Yoon
patent: 6094075 (2000-07-01), Garrett, Jr. et al.
patent: 6310814 (2001-10-01), Hampel et al.
patent: 6313670 (2001-11-01), Song et al.
patent: 6442644 (2002-08-01), Gustavson et al.
patent: 6462588 (2002-10-01), Lau et al.
patent: 6546343 (2003-04-01), Batra et al.
patent: 0482392 (1991-02-01), None
patent: 63-276935 (1988-11-01), None
patent: 03-087907 (1991-04-01), None
patent: 04-117709 (1992-04-01), None
patent: 02000035831 (2000-02-01), None
Sasaki, H., et al., “High Precision Automated Resistance Measurement Using A Modified Wheatstone Bridge,” CPEM '88 Digest, Japan, 1988, 1 page.
Sasaki, H., et al.,“Measurement of the Pressure Dependence of Standard Resistors Using A Modified Wheatstone Bridge,” Trans. IEE of Japan, vol. 109, No. 1/2,Jan./Feb. 1989, 6 pages.
Sasaki, H., et al., “Automated Measurement System for 1-.OMEGA.Standard Resistors Using A Modified Wheatstone Bridge,” IEEE Trans. on Instr. and Measurement, vol. 40, No. 2, Apr. 1991, p. 274-277.
Sasaki, H., et al., “A Modified Wheatstone Bridge for High-Precision Automated Resistance Measurement,” IEEE Trans. on Instr. and Measurement, vol. 26, No. 2, Dec. 1987, p. 947-949.
Armstrong, David H., “Pitfalls in Testing Digital ASIC Devices,” IEEE 1987 Custom Integrated Circuits Conference, pp. 573-578.
Mathews, John W. and Erdelyi, Charles K. “Power Supply Votages for Future VLSI,” IEEE 1986 Custom Integrated Circuits Conference, pp. 149-152.
Gillingham, Peter, MOSAID Technologies, Inc., “SLDRAM Architectural and Functional Overview”, 1997 SLDRAM Consortium, Aug. 29, 1997, pp. 1-14.
Gillingham, Peter, and Vogley, Bill, “SLDRAM” High-Performance, Open-Standard Memory, 1997 IEEE, Nov./Dec. 1997, pp. 29-39.
Draft 0.99 IEEE P1596.7-199X, “Draft Standard for A High-Speed Memory Interface (SyncLink)”, Oct. 14, 1996 IEEE.
Gabara et al., “Digitally Adjustable Resistors in CMOS for High-Performance Applications”, IEEE Journal of Solid-State Circuits, vol. 27, No. 8, Aug. 1992.
Reynolds, C.B., “Analysis and Guidelines for High-Speed VLSI System Interconnections,” IEEE 1988 Custom Integrated Circuits Conference, pp. 23.5.1-23.5.4.
Leung, Kam, “Controlled Slew Rate Output Buffer,” IEEE 1988 Custom Integrated Circuits Conference, pp. 5.5.1-5.5.4.
Knight, Thomas F. Jr., and Krymm, Alexander, “A Self-Terminating Low-Voltage Swing CMOS Output Driver,” Journal of Solid State Circuits, vol. 23, No. 2, Apr. 1998, pp. 457-464.
Cox, Dennis T., et al.,“VLSI Performance Compensation for Off-Chip Drivers and Clock Generation,” IEEE 1989 Custom Integrated Circuits Conf., pp. 14.3.1-14.3.4.
Douseki, Takakuni and Ohmori, Yasuo, “BICMOS Circuit Technology for a High-Speed SRAM,” IEEE Journal of Solid-State Circuits, vol. 23, No. 1, Feb. 1988, pp. 68-73.
“Driver with Noise-Dependent Switching Speed Control,” IBM Technical Disclosure Bulletin, vol. 29, No. 3, Aug. 1986, IBM Corporation, pp. 1243-1244.
Biber, Alice I. “The Design of an Application Specific Interface Drive for a High Capacitive Load,” Masters Thesis at the Massachusetts Inst. of Technology, Dec. 1989.
Raver, Norman, “Open-Loop Gain Limitations for Push-Pull Off-Chip Drivers,” Journal of Solid-State Circuits, vol. SC-22, No. 2, Apr. 1987, pp. 145-150.
Senbon, T. and Hanabuchi, F., Instrumentation Systems: Fundamentals and Applications, Chapter 3: Detection and Conversion of Industrial Variables; 1991, 11 pages.
Johnson, C. and Richeh, H, “Highly Accurate Resistance Deviation to Frequency Converter with Programmable Sensitivity and Resolution,” IEEE vol. IM-35, No. 2, Jun. 1986, 4 pages.

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