Method and producing probe with minute aperture, scanning near-f

Details Method and producing probe with minute aperture, scanning near-f Method and producing probe with minute aperture, scanning near-f

1997-03-27

2000-04-04

Tran, Thang V.

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Electrical modification or sensing of storage medium

250306, 250234, G11B 700

Patent

active

060469722

ABSTRACT:
In a method of manufacturing a probe with a minute aperture, the probe is coated with conductive material, a tip of the probe is brought into contact with a conductive substrate and a voltage is applied between the probe and the substrate to remove the coating material at the tip of the probe and form the minute aperture at the tip of the probe. The thus-fabricated probe can be used in a scanning near-field optical microscope for observing an object on the basis of a change in intensity of near-field light and an information recording and/or reproducing apparatus for reproducing information recorded in a record medium by using near-field light.

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"New Form of Scanning Optical Microscopy", R. C. Reddick, et al., Physical Review B, Condensed Matter, vol. 39, No. 1 (Jan. 1989), pp. 767-770.
"Near-Field Optical Scanning Microscopy", U. Durig et al, Journal of Applied Physics, vol. 59, No. 10 (May 1986), pp. 3318-3327.

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