Contactor assembly for common grid array devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S761010

Reexamination Certificate

active

07123034

ABSTRACT:
A contactor apparatus used in automatic testing of integrated circuits is provided. The invented apparatus, or assembly, enables the rapid automated test transition from testing a plurality of devices of a first body shape to a plurality of devices having a second body shape, where both types of devices have electrical contacts arranged within a device contact plane and according to a common grid pattern. The common grid pattern may be arranged along an X and an orthogonal Y axis, where contact points are spaced at identical intervals along each axis, e.g. a contact point at each 0.8 millimeter by 0.8 millimeter location, or where the contact points are spaced at differing intervals in each dimension, e.g. a plurality of contact points located at 0.8 millimeter lengths along the X axis and at 1.2 millimeter lengths along the Y axis. The contactor may have a plurality of apertures useful to simultaneously test a plurality of devices.

REFERENCES:
patent: 5570033 (1996-10-01), Staab
patent: 5705932 (1998-01-01), Fredrickson
patent: 5748007 (1998-05-01), Gaschke
patent: 5955888 (1999-09-01), Frederickson et al.
patent: 6069482 (2000-05-01), Hilton
patent: 6181149 (2001-01-01), Godfrey et al.
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6489788 (2002-12-01), Sausen

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