Semiconductor laser device

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is

Reexamination Certificate

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Details

C257S098000, C257SE29092, C372S075000, C372S043010, C372S050100

Reexamination Certificate

active

07129512

ABSTRACT:
The present invention provides a semiconductor laser device including a heat sink having one main surface, an n-AlGaAs cladding layer disposed on the main surface of the heat sink, an AlGaAs active layer disposed on the n-AlGaAs cladding layer and a p-AlGaAs cladding layer disposed on the AlGaAs active layer. An effective refractive index and a thermal resistance between a main surface on the heat sink side, of the AlGaAs active layer and a main surface on the heat sink side, of the n-AlGaAs cladding layer are respectively set smaller than those between a main surface on the side opposite to the heat sink, of the AlGaAs active layer and a main surface on the side opposite to the heat sink, of the p-AlGaAs cladding layer.

REFERENCES:
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patent: 7-38193 (1995-02-01), None
patent: 7-170017 (1995-07-01), None
patent: 11-233883 (1999-08-01), None
M. A. Afromowitz, “Thermal conductivity of Ga1-xAlxAs alloys”, J. Appl. Phys. vol. 44, No. 3, Mar. 1973, pp. 1292-1294.
H. C. Casey Jr., et al. “Refractive Index of AlxGa1-xAs between 1.2 and 1.8 eV”, Appl. Phys. Lett., vol. 24, No. 2, pp. 63-65, 1974.
W. B. Joyce, et al., “Thermal resistance of heterostructure lasers”, J. Appl. Phys., vol. 46, No. 2, pp. 855-862, 1975.
H. Tanaka, et al., “Refractive indices of In0.49Ga0.51-xAlxP lattice matched to GaAs”, J. Appl. Phys., vol. 59, No. 3, pp. 985-986, 1986.
H. Fujii, et al. “Effect pf thermal resistivity on the catastrophic optical damage power density og AlGalnP laser diodes”, Appl. Phys. Lett, vol. 62, No. 17, pp. 2114-2115, 1993.

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