Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2006-10-10
2006-10-10
Rosasco, S. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
Reexamination Certificate
active
07118835
ABSTRACT:
A method of forming a device pattern of a semiconductor device. The method includes the steps of carrying out an over-exposure to a resist film using a mask which has transmission regions which are positioned about a circumference of each of intended patterns of a resist film. Then carrying out a development of the resist film to form a resist pattern having the intended patterns. And then forming a device pattern of a semiconductor device by use of the resist pattern.
REFERENCES:
patent: 4525448 (1985-06-01), Ghosh
patent: 4657379 (1987-04-01), Suwa
patent: 5298365 (1994-03-01), Okamoto et al.
patent: 5585210 (1996-12-01), Lee et al.
patent: 5712063 (1998-01-01), Ahn et al.
patent: 5725973 (1998-03-01), Han et al.
patent: 5736300 (1998-04-01), Mizuno et al.
patent: 6015641 (2000-01-01), Chou
patent: 6057064 (2000-05-01), Lin
patent: 6511791 (2003-01-01), Bukofsky et al.
patent: 61-270823 (1986-12-01), None
patent: 7-134395 (1995-05-01), None
NEC Electronics Corporation
Rosasco S.
Young & Thompson
LandOfFree
Semiconductor device and method of forming the same as well... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and method of forming the same as well..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of forming the same as well... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3701068