Circuits for transistor testing

Details Circuits for transistor testing Circuits for transistor testing

2006-12-05

2006-12-05

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C324S537000, C257S048000

Reexamination Certificate

active

07145356

ABSTRACT:
Disclosed is a circuit for transistor testing, by which electrical stresses of separate conditions can be simultaneously applied to a plurality of transistors, respectively. According to one example, such a circuit may include a plurality of contact pads connectable to a plurality of terminals of a plurality of transistors, a plurality of first resistors connected to a plurality of gates of a plurality of the transistors, respectively by voltage distribution according to a resistance ratio, respectively, and a plurality of second resistors connected between a plurality of gate electrodes and drains of a plurality of the transistors, respectively wherein a plurality of voltages applied to a plurality of the gates of a plurality of the transistors are dropped by a plurality of the second resistors to be applied to a plurality of drains of a plurality of the transistors, respectively.

REFERENCES:
patent: 4309627 (1982-01-01), Tabata
patent: 5331599 (1994-07-01), Yero
patent: 5561373 (1996-10-01), Itoh

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