Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
Reexamination Certificate
2006-12-12
2006-12-12
Fourson, George R. (Department: 2823)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
C438S479000, C257SE21122
Reexamination Certificate
active
07148121
ABSTRACT:
An SOI architecture is provided that comprises an inner substrate10which has a buried conductor layer12formed on an outer surface thereof. A bonding layer14is used to provide a cohesive bond with a buried insulator layer18.The semiconductor device layer20is formed on the outer surface of buried insulator layer18.An inductive well22can be formed to provide a platform for the formation of inductive devices34within an inductive region26.
REFERENCES:
patent: 5536361 (1996-07-01), Kondo et al.
patent: 6255731 (2001-07-01), Ohmi et al.
Brady III Wade James
Fourson George R.
Maldonado Julio J.
Tung Yingsheng
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