Semiconductor on insulator device architecture and method of...

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S479000, C257SE21122

Reexamination Certificate

active

07148121

ABSTRACT:
An SOI architecture is provided that comprises an inner substrate10which has a buried conductor layer12formed on an outer surface thereof. A bonding layer14is used to provide a cohesive bond with a buried insulator layer18.The semiconductor device layer20is formed on the outer surface of buried insulator layer18.An inductive well22can be formed to provide a platform for the formation of inductive devices34within an inductive region26.

REFERENCES:
patent: 5536361 (1996-07-01), Kondo et al.
patent: 6255731 (2001-07-01), Ohmi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor on insulator device architecture and method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor on insulator device architecture and method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor on insulator device architecture and method of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3689737

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.