Testing apparatus and testing method

Details Testing apparatus and testing method Testing apparatus and testing method

2006-11-14

2006-11-14

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C375S226000

Reexamination Certificate

active

07136773

ABSTRACT:
A testing apparatus for testing an electronic device, includes a deterministic jitter applying means for applying deterministic jitter to a given input signal without any amplitude variation component occurring and supplying the input signal applied with the deterministic jitter to the electronic device, a jitter amount controlling means for controlling magnitude of the deterministic jitter to be applied by the deterministic jitter applying means and a judging means for judging quality of the electronic device based on an output signal outputted by the electronic device in response to the input signal.

REFERENCES:
patent: 4654861 (1987-03-01), Godard
patent: 4825379 (1989-04-01), Luthra et al.
patent: 5710517 (1998-01-01), Meyer
patent: 5793822 (1998-08-01), Anderson et al.
patent: 6246717 (2001-06-01), Chen et al.
patent: 6356850 (2002-03-01), Wilstrup et al.
patent: 2002/0174159 (2002-11-01), Laquai

Affiliated with

Also associated with

Rating

Testing apparatus and testing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing apparatus and testing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing apparatus and testing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3674567