Optimized underlayer structures for maintaining chemical mechani

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

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257752, H01L 2352

Patent

active

060344342

ABSTRACT:
A method of forming sharp oxide peaks on the surface of a semiconductor wafer for the purpose of conditioning polishing pads used during a Chemical Mechanical Polishing process is disclosed. In order to create oxide peaks on the surface of a wafer, additional elements are added to a trace layer of the wafer. An oxide layer is deposited over the additional elements using an Electron Cyclotron Resonance Chemical Vapor Deposition process, which includes a sputtering step, in order to create sharp peaks in the oxide layer over the additional lines. In some embodiments, the additional elements may be formed from a multiplicity of rectangular blocks over which pyramid-like oxide peaks are created. In others, they may be formed from a multiplicity of rectangular blocks connected by narrow lines over which pyramid-like oxide peaks and knife-edged peaks, respectively, are created.

REFERENCES:
patent: 4676868 (1987-06-01), Riley et al.
patent: 4775550 (1988-10-01), Chu et al.
patent: 4916514 (1990-04-01), Nowak
patent: 5003062 (1991-03-01), Yen
patent: 5089442 (1992-02-01), Olmer
patent: 5278105 (1994-01-01), Eden et al.
patent: 5461010 (1995-10-01), Chen et al.
patent: 5470802 (1995-11-01), Gnade et al.
patent: 5488015 (1996-01-01), Havemann et al.
patent: 5494853 (1996-02-01), Lur
patent: 5494854 (1996-02-01), Jain
patent: 5510293 (1996-04-01), Numata
patent: 5612241 (1997-03-01), Jain
patent: 5618757 (1997-04-01), Bothra et al.
Ichikawa et al "Multilevel Interconnect system for 0.35 .mu.m CMOS LST's With Metal Dummy Planization Process And Thin Tungsten Wiring" VMIC Conference, Jun. 27-29, 1995, pp. 254-260.

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