Method for the indirect identification of the intensity distribu

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324158D, 324 73R, 250310, 250311, G01R 1302, G01N 2300

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active

047884959

ABSTRACT:
For indirect identification of an intensity distribution of particle beam pulses generated in a particle beam measuring instrument by use of a beam blanking system, a signal s(t) known in terms of its time-dependency is periodically fed into a specimen and stroboscopically sampled according to the sampling principle. The desired intensity distribution of the particle beam pulses is subsequently calculated by de-convolution of the measured signal h(t) recorded by the measuring chain.

REFERENCES:
patent: 4037101 (1977-07-01), Okumura et al.
patent: 4220854 (1980-09-01), Feuerbaum
patent: 4407008 (1983-09-01), Schmidt et al.
patent: 4413181 (1983-11-01), Feuerbaum
patent: 4486660 (1984-12-01), Feuerbaum
Brigham: "The Fast Fourier Transform (FFT)", Prentice Hall (1974), Chapter 10, pp. 148-169.
Scanning Electron Microscopy (1979), "VLSI Testing Using the Electron Probe", by H. P. Feuerbaum, pp. 285-296.
Dissertation--E. Menzel--Universital--Gesemthuchschule, Duisburg (1981), pp. 89-95.
"Scanning", vol. 5 (1983), pp. 14-24--Electron Beam Testing: Methods and Applications, by H. P. Feuerbaum.

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