Method of manufacturing a probe array

Metal working – Method of mechanical manufacture – Electrical device making

Reexamination Certificate

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Details

Other Related Categories

C029S592100, C029S602100, C029S065000, C029S603150, C029S603160, C216S065000, C360S235700, C360S235800, C360S236300, C360S236500, C360S236600, C360S237000, C369S112010, C369S112050, C369S118000, C438S069000, C438S455000, C438S456000, C438S459000, C438S745000, C438S753000, C451S005000, C451S041000

Type

Reexamination Certificate

Status

active

Patent number

06993826

Description

ABSTRACT:
An optical-pickup slider is characterized in that a light-transmitting-property substrate is bonded to a surface of a layer having a tapered through hole, on which surface a larger opening of the tapered through hole exists. Thereby, it is possible to prevent the layer having an aperture from being destroyed. A method of manufacturing the optical-pickup slider comprises the steps of a) making a tapered through hole in a layer layered on a first substrate and having a thickness smaller than that of the first substrate; and, after bonding a light-transmitting-property substrate to a surface of the layer, removing the first substrate so as to expose an aperture at a tip of the tapered through hole.

REFERENCES:
patent: 1646249 (1927-10-01), Hoxie
patent: 4309075 (1982-01-01), Apfel et al.
patent: 4876680 (1989-10-01), Misawa et al.
patent: 5124961 (1992-06-01), Yamaguchi et al.
patent: 5208800 (1993-05-01), Isobe et al.
patent: 5667700 (1997-09-01), Rudigier et al.
patent: 5715226 (1998-02-01), Shimano et al.
patent: 5767020 (1998-06-01), Sakaguchi et al.
patent: 6129866 (2000-10-01), Hamanaka et al.
patent: 6304527 (2001-10-01), Ito et al.
patent: 6307827 (2001-10-01), Nishiwaki
patent: 2001/0030938 (2001-10-01), Oumi et al.
patent: 2002/0001283 (2002-01-01), Niwa et al.
patent: 06-331805 (1994-12-01), None
patent: 9-198830 (1997-07-01), None
patent: 11-045455 (1999-02-01), None
patent: 11083798 (1999-03-01), None
patent: 11-271339 (1999-10-01), None
patent: WO 00/28536 (2000-05-01), None
“A novel flying height measurement approach for optical sliders”; Binghe Ma; Morsbach, C.; Gatzen, H.H.; Sensors, 2003. AsiaSense 2003. Asia Conference on 2003 Page(s):29-32.
Lee et al., “Fabrication of Si planar aperture array for high speed near-field optical storage and readout”, Technical Digest of the Pacific Rim Conference on Laser and Electro-Optics, Makuhari, Japan, No. WL2, pp. 91-92, Jul. 1997.

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