Low circuit overhead built in self test for oversampled ADC's

Details Low circuit overhead built in self test for oversampled ADC's Low circuit overhead built in self test for oversampled ADC's

2006-06-13

2006-06-13

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C341S120000, C341S155000

Reexamination Certificate

active

07062401

ABSTRACT:
Circuitry and a method for testing oversampled Analog to Digital converters. The voltage reference is used as the input signal, thus eliminating the need for a special signal generator. The dynamic signal is obtained by not sampling the voltage reference on every sample. Instead, a state machine is used to gate the sampling of the voltage reference, which in turn causes a varying amount of change to be injected into the first integrator in the converter. As a result, the state machine effectively simulates many input levels.

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