Circuit pattern inspection apparatus, circuit pattern...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

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Details

C324S537000, C324S690000

Reexamination Certificate

active

06995566

ABSTRACT:
Disclosed is a circuit-pattern inspection apparatus for inspecting a comb-shaped pattern20having an edge region formed as a plurality of finger pattern segments and a base region formed as an integral connection pattern segment, and a plurality of discrete patterns30each disposed between the adjacent finger pattern segments in a non-connecting manner and being not in connecting with the remaining discrete patterns. The inspection apparatus comprises means for supplying an AC signal alternately to either one of the finger pattern segments and both the finger pattern segments and the discrete patterns while maintaining the other at a ground potential, and sensors131, 132, 133for detecting the AC signal disposed in the edge region. The inspection apparatus can reliably detect the presence of defects in a circuit board without any difficulties.

REFERENCES:
patent: 6110643 (2000-08-01), Rath et al.
patent: 6201398 (2001-03-01), Takada
patent: 6316949 (2001-11-01), Yamashita
patent: 6771077 (2004-08-01), Hamamura et al.
patent: 05-333357 (1993-12-01), None
patent: 06-70664 (1994-09-01), None
patent: 7-146323 (1995-06-01), None
patent: 2000-155149 (2000-06-01), None
patent: 2001-41994 (2001-02-01), None
patent: 2001-296326 (2001-10-01), None

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