Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Reexamination Certificate
2006-11-07
2006-11-07
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Junction field effect transistor
28, C438S570000
Reexamination Certificate
active
07132703
ABSTRACT:
A field-effect transistor includes: a carrier supply layer supplying carriers; a Schottky contact layer forming a Schottky barrier; and an intermediate layer formed between the carrier supply layer and the Schottky contact layer. Here, the intermediate layer has an electron affinity which is higher than an electron affinity of the carrier supply layer but lower than an electron affinity of the Schottky contact layer.
REFERENCES:
patent: 6064082 (2000-05-01), Kawai et al.
patent: 2003/0218183 (2003-11-01), Micovic et al.
Nienhaus, H. et al., “Ionization Energy and Electron Affinity of Clean and Oxidized AlxGa1-xN (0001) Surfaces”, Mat. Res. Soc. Symp. Proc. 680 (2001) E4.5, p. 1; http://fkpme246a.uni-duisburg.de/ag—lorke/publications
ienhaus/article-Nienhaus-id134.pdf.
Hikita Masahiro
Yanagihara Manabu
Flynn Nathan J.
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
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