Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1995-10-10
1997-04-15
McGraw, Vincent P.
Optics: measuring and testing
For optical fiber or waveguide inspection
G01N 2188
Patent
active
056215185
ABSTRACT:
This invention relates to a method and an apparatus for performing exceptionally linear averaging of digitized signals in an optical time domain reflectometer. Resolutions far below the quantization level of the ADC with improved linearity can be achieved without sacrificing dynamic range. Such method can be used to improve measurement accuracy on optical fibers under test.
REFERENCES:
patent: 4928232 (1990-05-01), Gentile
The Transactions of the IECE of Japan, vol. E67, No. 9, Sep. 1984, Tokyo, Japan, T. Horiguchi et al `Optical Time Domain Reflectometer for Single-Mode Fibers`, pp. 509, 510, 512 and 514.
Electronics and Communications in Japan--Part I: Communications, vol. 75, No. 12, Dec. 1992 New York (US), S. Furukawa et al `Enhancement of OTDR Performance with an Optical Fiber Amplifier`, pp. 76, 78, 80, 82, 84, 86.
European Search Report--Apr. 18, 1995.
Hewlett--Packard Company
McGraw Vincent P.
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