Method and apparatus for fast response and distortion measuremen

Details Method and apparatus for fast response and distortion measuremen Method and apparatus for fast response and distortion measuremen

1993-07-23

1995-05-30

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324626, 324624, 324623, 324576, G01R 2320

Patent

active

054205166

ABSTRACT:
A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.

REFERENCES:
patent: 3862380 (1975-01-01), Hekimian
patent: 4028622 (1977-06-01), Evans
patent: 4273970 (1981-06-01), Favin
patent: 4774454 (1988-09-01), Yamaguchi
Belcher: "A New Distortion Measurement"--Wireless World May 1978--pp. 36-41.
Boyd: "Multitone Signals with Low Crest Factor"--IEEE Trans. on Circuits & Systems--Oct. 1986.
Boyd: "Measuring Volterra Kernels"--IEEE Trans. on Circ. & Systems--Aug. 1983.
Nicolet--660A Dual Channel FFT Analyzer--Descriptive brochure--1980 (5 pages).
Pendergrass: "A high resolution Low Frequency Spectrum Analyzer" HP Journal--Sep. 1978--pp. 2-13.

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