Semiconductor storage device

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185250

Reexamination Certificate

active

07006385

ABSTRACT:
A nonvolatile memory device includes a memory cell array, a control circuit, a voltage boost circuit, a timer circuit, a discharge circuit and a sensor circuit. The control circuit generates an erase execution (EE) signal in response to an erase command (EC) signal, stops the EE signal and generates a discharge control (DC) signal in response to an erase termination (ET) signal, stops the DC signal in response to a discharge termination (DT) signal, and stops the EE signal and the DC signal in response to a reset signal. The boost circuit provides high voltage in response to the EE signal. The timer circuit generates the ET signal after receiving the EE signal. The discharge circuit discharges the high voltage and the sensor is enabled in response to the DC signal or the reset signal. The sensor generates the DT signal when the high voltage drops to a predetermined voltage.

REFERENCES:
patent: 6747902 (2004-06-01), Seki et al.
patent: 6909639 (2005-06-01), Park et al.
patent: 2000-100183 (2000-04-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor storage device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor storage device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor storage device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3643650

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.