Process for fabricating films of uniform properties on...

Semiconductor device manufacturing: process – With measuring or testing

Reexamination Certificate

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C438S016000, C438S795000, C427S573000, C427S574000

Reexamination Certificate

active

07060514

ABSTRACT:
A process for forming a thin layer exhibiting a substantially uniform property on an active surface of a semiconductor substrate includes varying the temperature within a reaction chamber while a layer of a material is formed upon the semiconductor substrate. Varying the temperature within the reaction chamber facilitates temperature uniformity across the semiconductor wafer. As a result, a layer forming reaction occurs at a substantially consistent rate over the entire active surface of the semiconductor substrate. The process may also include oscillating the temperature within the reaction chamber while a layer of a material is being formed upon a semiconductor substrate.

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