Flash memory

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185330, C365S185310, C365S185180, C365S185240, C365S218000

Reexamination Certificate

active

07046557

ABSTRACT:
Flash memory devices having control circuitry to decrease the magnitude of a source voltage of a first polarity during an erase period to increase the magnitude of a control gate voltage of a second polarity applied during the erase period.

REFERENCES:
patent: 5357463 (1994-10-01), Kinney
patent: 5402382 (1995-03-01), Miyawaki et al.
patent: 5485423 (1996-01-01), Tang et al.
patent: 5650964 (1997-07-01), Chen et al.
patent: 5726933 (1998-03-01), Lee et al.
patent: 5740103 (1998-04-01), Papadas et al.
patent: 5781477 (1998-07-01), Rinerson et al.
patent: 5828605 (1998-10-01), Peng et al.
patent: 5838618 (1998-11-01), Lee et al.
patent: 5862078 (1999-01-01), Yeh et al.
patent: 5917755 (1999-06-01), Rinerson et al.
patent: 5949715 (1999-09-01), Seki et al.
patent: 5949717 (1999-09-01), Ho et al.
patent: 5991195 (1999-11-01), Nobukata
patent: 6026026 (2000-02-01), Chan et al.
patent: 6049484 (2000-04-01), Lee et al.
patent: 6049486 (2000-04-01), Lee et al.
patent: 6055183 (2000-04-01), Ho et al.
patent: 6122201 (2000-09-01), Lee et al.
patent: 6169693 (2001-01-01), Chan et al.
patent: 6236608 (2001-05-01), Ratnam
patent: 6243299 (2001-06-01), Rinerson et al.
patent: 6285588 (2001-09-01), Fastow
patent: 6614693 (2003-09-01), Lee et al.
patent: 6795348 (2004-09-01), Mihnea et al.
patent: 2003/0223272 (2003-12-01), Mihnea et al.
patent: 410055689 (1998-02-01), None
patent: 410334677 (1998-12-01), None
Lee et al., “Using Erase Self-Detrapped Effect To Eliminate the FLash Cell Program/Erase Cycling VthWindow Close,” IEEE, 1999.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Flash memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Flash memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flash memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3635567

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.