Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2006-05-16
2006-05-16
Nguyen, Viet Q. (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185330, C365S185310, C365S185180, C365S185240, C365S218000
Reexamination Certificate
active
07046557
ABSTRACT:
Flash memory devices having control circuitry to decrease the magnitude of a source voltage of a first polarity during an erase period to increase the magnitude of a control gate voltage of a second polarity applied during the erase period.
REFERENCES:
patent: 5357463 (1994-10-01), Kinney
patent: 5402382 (1995-03-01), Miyawaki et al.
patent: 5485423 (1996-01-01), Tang et al.
patent: 5650964 (1997-07-01), Chen et al.
patent: 5726933 (1998-03-01), Lee et al.
patent: 5740103 (1998-04-01), Papadas et al.
patent: 5781477 (1998-07-01), Rinerson et al.
patent: 5828605 (1998-10-01), Peng et al.
patent: 5838618 (1998-11-01), Lee et al.
patent: 5862078 (1999-01-01), Yeh et al.
patent: 5917755 (1999-06-01), Rinerson et al.
patent: 5949715 (1999-09-01), Seki et al.
patent: 5949717 (1999-09-01), Ho et al.
patent: 5991195 (1999-11-01), Nobukata
patent: 6026026 (2000-02-01), Chan et al.
patent: 6049484 (2000-04-01), Lee et al.
patent: 6049486 (2000-04-01), Lee et al.
patent: 6055183 (2000-04-01), Ho et al.
patent: 6122201 (2000-09-01), Lee et al.
patent: 6169693 (2001-01-01), Chan et al.
patent: 6236608 (2001-05-01), Ratnam
patent: 6243299 (2001-06-01), Rinerson et al.
patent: 6285588 (2001-09-01), Fastow
patent: 6614693 (2003-09-01), Lee et al.
patent: 6795348 (2004-09-01), Mihnea et al.
patent: 2003/0223272 (2003-12-01), Mihnea et al.
patent: 410055689 (1998-02-01), None
patent: 410334677 (1998-12-01), None
Lee et al., “Using Erase Self-Detrapped Effect To Eliminate the FLash Cell Program/Erase Cycling VthWindow Close,” IEEE, 1999.
Chen Chun
Mihnea Andrei
Leffert Jay & Polglaze P.A.
Micro)n Technology, Inc.
Nguyen Viet Q.
LandOfFree
Flash memory does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Flash memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flash memory will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3635567