Method of fabricating MRAM cells

Semiconductor device manufacturing: process – Having magnetic or ferroelectric component

Reexamination Certificate

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C257SE21665

Reexamination Certificate

active

07083990

ABSTRACT:
A method of fabricating an MRAM cell including providing a workpiece having at least one magnetic tunnel junction (MTJ) formed thereon, forming an insulating layer made of non-conductive, isolating material over the at least one MTJ, using a damascene process to form at least two adjacent first trenches in the insulating layer, filling the first trenches in the insulating material with a conductive material and polishing the conductive material to form conductive lines, etching of at least a second trench in the insulating layer in between the conductive lines, depositing a ferromagnetic liner material at least over the conductive lines and the second trench; and removing of the ferromagnetic liner material from the bottom surface of said second trench to form ferromagnetic liners of the conductive lines. The second trench has side walls and a bottom surface at a specified aspect ratio.

REFERENCES:
patent: 6413788 (2002-07-01), Tuttle
patent: 6707083 (2004-03-01), Hiner et al.
patent: 6803615 (2004-10-01), Sin et al.
patent: 6921953 (2005-07-01), Deak
patent: 2003/0206434 (2003-11-01), Lauschner et al.
patent: 2006/0019487 (2006-01-01), Leuschner et al.
patent: 2006/0022286 (2006-02-01), Leuschner et al.

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