Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-08-22
2006-08-22
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07096145
ABSTRACT:
A system is described that includes a microprocessor and a thermal control subsystem. The microprocessor includes execution resources to support processing of instructions and consumes power. The microprocessor also includes at least one throttling mechanism to reduce the amount of heat generated by the microprocessor. The thermal control subsystem is configured to estimate an amount of power used by the microprocessor and to control the throttling mechanism based on the estimated amount of current power usage to ensure that junction temperature will not exceed the maximum allowed temperature.
REFERENCES:
patent: 5287292 (1994-02-01), Kenny et al.
patent: 5719800 (1998-02-01), Mittal et al.
patent: 5781783 (1998-07-01), Gunther et al.
patent: 6192479 (2001-02-01), Ko
patent: 6443123 (2002-09-01), Aoki et al.
patent: 6564328 (2003-05-01), Grochowski et al.
patent: 6789037 (2004-09-01), Gunther et al.
patent: 2002/0073348 (2002-06-01), Tani
patent: 2003/0065960 (2003-04-01), Rusu et al.
patent: 0 549 165 (1993-06-01), None
patent: WO 99/17186 (1999-04-01), None
PCT Search Report for co-pending PCT application No. PCT/US02/41439 mailed Sep. 15, 2003.
Orenstien Doron
Ronen Ronny
Lau Tung S.
Nghiem Michael
LandOfFree
Deterministic power-estimation for thermal control does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Deterministic power-estimation for thermal control, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deterministic power-estimation for thermal control will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3627015