Semiconductor device suited for a high frequency amplifier

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device

Reexamination Certificate

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Details

C257S189000, C257S191000, C257S196000, C257S197000, C257S198000, C257S200000, C257S201000, C257S615000

Reexamination Certificate

active

07038250

ABSTRACT:
According to the present invention, there is a provided a semiconductor device having, a collector contact layer made of an n-type GaAs layer; a first collector layer formed on the collector contact layer and made of an n-type GaAs layer; a second collector layer formed on the first collector layer and made of a p-type GaAs layer; a third collector layer formed on the second collector layer and made of an n-type InGaP layer; a fourth collector layer formed on the third collector layer and made of an n-type InGaP layer having an impurity concentration higher than that of the third collector layer; a fifth collector layer formed on the fourth collector layer and made of an n-type GaAs layer; a base layer formed on the fifth collector layer and made of a p-type GaAs layer; and an emitter layer formed on the base layer and made of an n-type InGaP layer.

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T. Tanaka, et al., Journal of Crystal Growth, vol. 221, pp. 515-519, “Ordering-Induced Electron Accumulation at GaInP/GaAs Hetero-Interfaces”, 2000.
J.-I. Song, et al., Electronic Letters, vol. 29, No. 21, pp. 1881-1883, “Characterisation of GaInP/GaAs Double Heterojunction Bipolar Transistors With Different Collector Designs”, Oct. 14, 1993.

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