Surrounding structure for a probe card

Details Surrounding structure for a probe card Surrounding structure for a probe card

2006-05-30

2006-05-30

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07053638

ABSTRACT:
A surrounding structure of a probe card is described, and particularly an isolator unit, which is formed by filling in a wire leading region with epoxy material to substitute for an originally clear portion, so as to improve high impedance characteristics of the cross-over portion by using the resultant parasitic capacitance effect, and improve the compensation for the purpose of impedance matching. Additionally, the energy loss is reduced and the application frequency range is widened.

REFERENCES:
patent: 4523144 (1985-06-01), Okubo et al.
patent: 4719417 (1988-01-01), Evans
patent: 5670889 (1997-09-01), Okubo et al.
patent: 6137297 (2000-10-01), McNair et al.
patent: 6515358 (2003-02-01), Dass et al.

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