Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-04-11
2006-04-11
Chawan, Sheela (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S149000, C382S312000, C250S559140, C356S237100, C356S237200
Reexamination Certificate
active
07027640
ABSTRACT:
The present invention provides an apparatus and method for detecting or inspecting defects on a polishing pad for use in performing chemical mechanical polishing of a wafer. The apparatus for detecting the defects on the pad comprises a pad driving device for loading the pad thereon and moving the pad, at least one camera installed to face the pad for converting an image of the pad into an electrical signal and outputting the converted electrical signal, a digital image data acquisition device for converting the electrical signal transmitted from the camera into a digital signal, and an image data processing unit for processing the image data and detecting the defects on the pad.
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Park Sung-Jin
Ryu Chan-Ho
Chawan Sheela
Nanometrics Incorporated
Silicon Valley Patent & Group LLP
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