High frequency scanning SQUID microscope and method of...

Electricity: measuring and testing – Magnetic – Magnetometers

Reexamination Certificate

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C505S846000

Reexamination Certificate

active

07106057

ABSTRACT:
A scanning SQUID microscope capable of high frequency magnetic field measurements uses a hysteretic SQUID detector and a pulsed sampling technique which permits to extend the bandwidth of the SQUID microscope to above GHz region. The system can be readily incorporated into a 4.2kscanning SQUID microscope for imaging chips at room temperature. By biasing the hysteretic SQUID with pulses of a predetermined amplitude, and adjusting a modulation flux applied to the hysteretic SQUID at a plurality of time delays between the activation of the sample under study and the bias pulse, the hysteretic SQUID can be switched on, and the modulation flux value corresponding to such a switching event as a function of time is considered as representation of the magnetic field emanating from the sample under study.

REFERENCES:
patent: 5045788 (1991-09-01), Hayashi et al.
patent: 5095270 (1992-03-01), Ludeke

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