Method and apparatus for enabling reliable testing of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S1540PB, C324S754090

Reexamination Certificate

active

07053642

ABSTRACT:
A method and apparatus allows adapting a standard flying prober system to probe test point targets on Printed Circuit Assemblies (PCAs) having irregularities in their planarity. The method and apparatus involves positioning a camera utilized by the prober system to predetermined offset positions relative to previously established test and/or other points for sets of images. Each set of images is processed by determining offsets in coordinates needed to align the images in a predetermined manner. The offsets for each measured point are translated into actual height values to be used during subsequent testing of a PCA.

REFERENCES:
patent: 6445172 (2002-09-01), Park et al.
patent: 6563324 (2003-05-01), Nichani
patent: 6621275 (2003-09-01), Cotton et al.

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