Multiple views for a measurement system diagram

Details Multiple views for a measurement system diagram Multiple views for a measurement system diagram

2006-05-09

2006-05-09

Luu, Matthew (Department: 3663)

Computer graphics processing and selective visual display system

Computer graphics processing

Graphic manipulation

C345S667000, C345S670000

Reexamination Certificate

active

07042469

ABSTRACT:
A system and method for displaying multiple views of a diagram of a measurement system. A first view of the diagram of the measurement system may be displayed at a first scale. The first view may illustrate a first portion, but not all, of the diagram. A second view of the diagram of the measurement system may be displayed at a second scale, where the second scale is a reduced scale relative to the first scale. The second view may illustrate all of the diagram, e.g., may provide an overview of the entire measurement system. The second view may be displayed on a substantially smaller area of the display than the first view of the diagram. For example, in the first view of the diagram, components of the measurement system may be displayed at a scale large enough to enable the user to interact with the components. On the other hand, the second view of the diagram may not be intended for editing the diagram, and components of the measurement system may be displayed at a small scale in the second view. A visual indication may be displayed within the second view to indicate the first portion of the diagram which is illustrated by the first view. In one embodiment, the second view of the diagram may enable the user to navigate through the diagram, i.e., to change the portion of the diagram illustrated by the first view.

REFERENCES:
patent: 4812996 (1989-03-01), Stubbs
patent: 4823303 (1989-04-01), Terasawa
patent: 4868785 (1989-09-01), Jordan et al.
patent: 4884228 (1989-11-01), Stanley et al.
patent: 5136705 (1992-08-01), Stubbs et al.
patent: 5155836 (1992-10-01), Jordan et al.
patent: 5301301 (1994-04-01), Kodosky et al.
patent: 5301336 (1994-04-01), Kodosky et al.
patent: 5309352 (1994-05-01), Stubbs
patent: 5481741 (1996-01-01), McKaskle et al.
patent: 5615384 (1997-03-01), Allard et al.
patent: 5630164 (1997-05-01), Williams et al.
patent: 5801942 (1998-09-01), Nixon et al.
patent: 5812394 (1998-09-01), Lewis et al.
patent: 5828851 (1998-10-01), Nixon et al.
patent: 5838563 (1998-11-01), Dove et al.
patent: 5861882 (1999-01-01), Sprenger et al.
patent: 5991537 (1999-11-01), McKeon et al.
patent: 6052130 (2000-04-01), Bardon et al.
patent: 6064816 (2000-05-01), Parthasarathy et al.
patent: 6078320 (2000-06-01), Dove et al.
patent: 6098028 (2000-08-01), Zwan et al.
patent: 6229536 (2001-05-01), Alexander et al.
patent: 6441802 (2002-08-01), Tani et al.
patent: 6623119 (2003-09-01), Lehmeier et al.
patent: 6707454 (2004-03-01), Barg et al.
patent: 2001/0048447 (2001-12-01), Jogo
patent: 2003/0231211 (2003-12-01), Shah et al.

Affiliated with

Also associated with

Rating

Multiple views for a measurement system diagram does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multiple views for a measurement system diagram, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multiple views for a measurement system diagram will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3605807