Method for manufacturing a gallium nitride group compound...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal

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C438S483000

Reexamination Certificate

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06984536

ABSTRACT:
Disclosed herein are (1) a light-emitting semiconductor device that uses a gallium nitride compound semiconductor (AlxGa1−xN) in which the n-layer of n-type gallium nitride compound semiconductor (AlxGa1−xN) is of double-layer structure including an n-layer of low carrier concentration and an n+-layer of high carrier concentration, the former being adjacent to the i-layer of insulating gallium nitride compound semiconductor (AlxGa1−xN); (2) a light-emitting semiconductor device of similar structure as above in which the i-layer is of double-layer structure including an iL-layer of low impurity concentration containing p-type impurities in comparatively low concentration and an iH-layer of high impurity concentration containing p-type impurities in comparatively high concentration, the former being adjacent to the n-layer; (3) a light-emitting semiconductor device having both of the above-mentioned features and (4) a method of producing a layer of an n-type gallium nitride compound semiconductor (AlxGa1−xN) having a controlled conductivity from an organometallic compound by vapor phase epitaxy, by feeding a silicon-containing gas and other raw material gases together at a controlled mixing ratio.

REFERENCES:
patent: 4153905 (1979-05-01), Charmakadze et al.
patent: 4268842 (1981-05-01), Jacob et al.
patent: 4396929 (1983-08-01), Ohki et al.
patent: 4408217 (1983-10-01), Kobayashi
patent: 4473938 (1984-10-01), Kobayashi et al.
patent: 4608581 (1986-08-01), Bagratishvili et al.
patent: 4614961 (1986-09-01), Khan et al.
patent: 4844989 (1989-07-01), Murdock
patent: 4855249 (1989-08-01), Akasaki et al.
patent: 4911102 (1990-03-01), Manabe et al.
patent: 4946548 (1990-08-01), Kotaki et al.
patent: 5005057 (1991-04-01), Izumiya et al.
patent: 5006908 (1991-04-01), Matsuoka et al.
patent: 5076860 (1991-12-01), Ohba et al.
patent: 5079184 (1992-01-01), Hatano et al.
patent: 5205905 (1993-04-01), Kotaki et al.
patent: 5218216 (1993-06-01), Manabe
patent: 5247533 (1993-09-01), Okazaki et al.
patent: 5278433 (1994-01-01), Manabe et al.
patent: 2-738329 (1978-03-01), None
patent: 3-046018 (1981-09-01), None
patent: 4006449 (1990-09-01), None
patent: 0-277597 (1988-08-01), None
patent: 0 620 203 (1994-10-01), None
patent: 1-589351 (1981-05-01), None
patent: 49-29771 (1972-07-01), None
patent: 5-042785 (1975-04-01), None
patent: 54-071589 (1979-06-01), None
patent: 54-071590 (1979-06-01), None
patent: 56-59699 (1981-05-01), None
patent: 56-080183 (1981-07-01), None
patent: 57-018377 (1982-01-01), None
patent: 57-087184 (1982-05-01), None
patent: 57-153479 (1982-09-01), None
patent: 57-046669 (1982-10-01), None
patent: 58-012381 (1983-01-01), None
patent: 58-046686 (1983-03-01), None
patent: 58-200527 (1983-11-01), None
patent: 60-173829 (1984-02-01), None
patent: 59-228776 (1984-12-01), None
patent: 60-175468 (1985-09-01), None
patent: 61-007671 (1986-01-01), None
patent: 62-119196 (1987-05-01), None
patent: 63-188977 (1988-08-01), None
patent: S63-188938 (1988-08-01), None
patent: 02-042770 (1990-02-01), None
patent: 2623466 (1990-02-01), None
patent: 02-081482 (1990-03-01), None
patent: 02-081483 (1990-03-01), None
patent: 02-081484 (1990-03-01), None
patent: 2-229475 (1990-09-01), None
patent: 2-275682 (1990-11-01), None
patent: 03-034549 (1991-02-01), None
patent: 34549 (1991-02-01), None
English Abstract of OKI Japanese Application Published Sep. 22, 1982 under No. 57-153479.
I. Akasaki et al., “Effects of AlN buffer Layer on Crystallographic Structure . . . by MOVPE”, J. Crystal Growth 98 (1989) pp. 209-219.
Liu et al., “Growth morphology and surface-acoustic-wave measurements of AlN films on Sapphire,” Journal of Applied Physics, vol. 46, No. 9, Sep. 1975, pp. 3703-3706.
Ilegems et al. “Electrical properties of n-Type Vapor-growth Gallium Nitride”, J. Phys. Chem. solids., 1973, vol. 34, pp. 885-895.
Koide et al. “Effect of an A1N Buffer Layer on AlGaNa-A1203 Heteroepitaxial Growth by MOVPE”, Japanese Journal of Crystal Growth 1986, vol. 13, No. 4, pp. 218-225.
Sayyah et al. “The Influence of TMA and SiH4 on the Incorporation Rate of GalNAlxGa1−xN Crystals Grown from TMG and NH3”, Journal of Crystal Growth 77 (1986), pp. 424-429 North-Holland, Amsterdam.
Bottka, et al., Silicon and beryllium doping of OMVPE Grown . . . , Journal of Crystal Growth 68 (1984) pp. 54-59, North-Holland Amsterdam.
Madar et al., “Growth Anisotrophy in the CaN/Al203 System,” Journal of Crystal Growth 40, 1997, pp. 239-252.
Koide et al., Epitaxial Growth and Properties of AlxGa1−xN by MOVPE, Reprinted from Journal of the Electrochemical Society, vol. 133, No. 9, Sep. 1996, pp. 1956-1960.
Boulou et al., “Light emitting Diodes Based on GaN”, Philips Tech. Rev., 37, 237-240 No. 9/10, 1977.
English Abstract of OOKI Japanese Application Published Sep. 19, 1982 under No. 57-153479.
I. Akusuki et al., “Effects of AlN Buffer Layer on Crystallographic Structure . . . by MOVPE”, J. Crystal Growth 98 (1989) pp. 209-219.
Sayyah, A Study of Growth Mechanisms and Electrical and Optical Properties of Epitaxial AlxGaxN Layers Grown by Atmospheric Pressure Metalorganic Chemical Vapor Deposition, A Dissertation presented to Faculty of the Graduate School, University of Southern California, Feb. 1986, pp. 125-136.
Koide et al., Epitaxial Growth and Properties of AlxGa1−xN by MOVPE, J. Electrochem. Soc.: Solid-State Science and Technology, vol. 133, No. 9, Sep. 1986, pp. 1956-1960.
Masakiyo Matsumura, Semiconductor Devices, Chapter 2, Principle of Diodes, 2.1: pn junction and rectification, Dec. 25, 1986, p. 13.
Kiyoshi Takahashi, Semiconductor Engineering: Basic Characteristics of Semiconductor, Morikita Electric Engineering Series, vol. 4, Chapter 14: Semiconductor Material Technics, 14:1 Forming of Semiconductor Material, Aug. 1, 1975, p. 297.
Hiroyuki Matsunami, Semiconductor Engineering, Chapter 2: Basic Characteristics of Semiconductor, Mar. 25, 1983, pp. 18-31.
Sano et al., Properties of III-V Nitride Semiconductors, Japanese Journal of Applied Physics, vol. 52, No. 5, 1983, pp. 374-387.
Miyoshi Haradome, Basics of Semiconductor Engineering, Chapter 8: Compound Semiconductor, 8:1, Conditions to be Semiconductor, Aug. 30, 1967, p. 161.
A.S. Grove, Physics and Technology of Semiconductor, Chapter 4: Basics of Semiconductor Physics, 1967, translated and published in Japan Jun. 23, 1995, pp. 112-123.
Kazuyo Kadota, The Invention, 39 New Technics Selected by Japan Patent Office; Laser Technics, vol. 94, No. 9 (the first volume); Sep. 1997, pp. 42-49.
Pankove et al., Optical Absorption of GaN, Applied Physics Letters, vol. 17, No. 5, Sep. 1970, pp. 197-198.
Amano et al., Effects of the Buffer Layer in Metalorganic Vapour Phase Epitaxy of GaN on Sapphire Substrate, Thin Solid Films, 163, (1988), pp. 415-420.
Akasaki et al., Effects of AlN Buffer Layer on Crystallographic Structure and on Electrical and Optical Properties of GaN and Ga1−xAlxN(0<x<0.4) Films Grown on Sapphire Substrate by MOVPE, Journal of Crystal Grown 98 (1989), pp. 209-219.
Bottka et al., Silicon and Beryllium Doping of OMVPE Grown AlxGa1−xAs (x=0-0.3) Using Silane and Diethylberyllium, Journal of Crystal Growth 68 (1984) pp. 54-59.
Hiramatsu et al. “Effects of Buffer Layer in MOVPE Growth of GaN Film on Sapphire Substrate” Japanese Journal of Crystal Growth, 1998, vol. 15, No. 3&4, pp. 334-342.
Elwell et al. “Crystal Growth of Gallium Nitride” Prog. Crystal Growth and Charact. 1988, vol. 17, pp. 53-78.
Amano,The Research of MOVPE Growth and Application to Photoelectric Physical Property of GaN and a Device Emitting Blue-Color Lights,Doctoral Dissertation of Nagoya University, Chapter 7.8 (pp. 80-94), Jan. 13, 1989.
Jacob et al.,Efficient Injection Mechanism for Electroluminescense in GaN,Applied Physics Letter, vol. 30, No. 8, pp. 412-414, Apr. 15, 1977.
Tietjen et al.,Vapor Phase Growth Technique and System for Several III-V Compound Semiconductor

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