Method for extracting objective image

Details Method for extracting objective image Method for extracting objective image

2006-09-05

2006-09-05

Chawan, Sheela (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S199000, C382S205000, C250S553000, C250S559300

Reexamination Certificate

active

07103209

ABSTRACT:
Noted portions of an image, such as a pin point hole in an isolated area or a pattern contour that forms a continuous boundary area, are clearly displayed by first erasing background noise by acquiring information regarding differences between an image detection signal (pixel) of each scanned position (dot) in matrix form and image detection signals of the surrounding scanned positions, and secondly, by adopting a value that is either a largest or smallest value greater than or equal to zero among a plurality of sets of information on value differences as new image information for the scanned position.

REFERENCES:
patent: 4908872 (1990-03-01), Toriu et al.
patent: 5887080 (1999-03-01), Tsubusaki et al.
patent: 6282309 (2001-08-01), Emery
patent: 6396943 (2002-05-01), Yamashita
patent: 6697497 (2004-02-01), Jensen et al.

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