Charge amount measurement method, shift value measurement...

Details Charge amount measurement method, shift value measurement... Charge amount measurement method, shift value measurement...

2006-03-07

2006-03-07

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S12100R

Reexamination Certificate

active

07009411

ABSTRACT:
A charge amount measurement method comprises: interposing a measurement subject between a first substance and a second substance having a through hole; measuring a first collision position where a charged beam passed through the through hole and vicinity of the measurement subject collides against the first substance, in a state that there is no potential difference between the first substance and the second substance, measuring a second collision position where a charged beam passed through the through hole and vicinity of the measurement subject collides against the first substance, in a state that there is a potential difference between the first substance and the second substance, and measuring a charge amount of the measurement subject based on a difference between the measured first collision position and the measured second collision position.

REFERENCES:
patent: 2240304 (1941-04-01), Koch
patent: 2394196 (1946-02-01), Morgan
patent: 2412350 (1946-12-01), Morgan
patent: 2457575 (1948-12-01), Liebscher
patent: 4628258 (1986-12-01), Lischke
patent: 5644220 (1997-07-01), Urs et al.
patent: 6479820 (2002-11-01), Singh et al.

Affiliated with

Also associated with

Rating

Charge amount measurement method, shift value measurement... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Charge amount measurement method, shift value measurement..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Charge amount measurement method, shift value measurement... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3595676