Method and probe structure for implementing a single probe...

Details Method and probe structure for implementing a single probe... Method and probe structure for implementing a single probe...

2006-01-17

2006-01-17

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

06987397

ABSTRACT:
A method and a probe structure are provided for implementing multiple signals probing of a printed circuit board. A probe structure is formed on an outside surface of the printed circuit board. A resistor is electrically connected with an associated via with a signal to be monitored. A path to a predefined probe location for monitoring the signal is defined from the resistor using the probe structure.

REFERENCES:
patent: 5014002 (1991-05-01), Wiscombe et al.
patent: 6462528 (2002-10-01), Markozen
patent: 6603323 (2003-08-01), Miller et al.
patent: 6747469 (2004-06-01), Rutten

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