Probe card for testing semiconductor device

Details Probe card for testing semiconductor device Probe card for testing semiconductor device

2006-03-21

2006-03-21

Dinh, Phuong (Department: 2839)

Electrical connectors

Including handle or distinct manipulating means

Randomly manipulated implement

C324S754090

Reexamination Certificate

active

07014499

ABSTRACT:
A probe card for testing semiconductor devices includes a main board member, an upper reinforcing plate, a lower reinforcing plate, an interface member, a sub board member, a needle guide member, a needle member, a side cover member, and a clamping member. The probe card achieves an interface between the circuit boards through elastic connection pins so as to cope with a connection shock with the connection terminals of a semiconductor device, thereby preventing damages on the boards, and has the component parts combined together simply by face contacts to facilitate assembly and disassembly of the component parts and thereby to provide a great economical advantage in the aspect of maintenance and repair.

REFERENCES:
patent: 5068601 (1991-11-01), Parmenter
patent: 5656943 (1997-08-01), Montoya et al.
patent: 6566898 (2003-05-01), Theissen et al.
patent: 6853205 (2005-02-01), Cheng et al.
patent: 2002/0109514 (2002-08-01), Brandorff et al.
patent: 2005/0140381 (2005-06-01), Sporck et al.

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